Xi'an Sihai Analytical Instrument Co., Ltd
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ZEM18 desktop scanning electron microscope
ZEM18 desktop scanning electron microscope
Product details

    Product Introduction

    The ZEM18 desktop scanning electron microscope has a signal acquisition bandwidth of up to 10M, fast scanning speed, and real-time observation of samples in video mode without ghosting or dragging, ensuring that every detail is not missed. Compatible with multiple in-situ functional sample stages (such as stretching stage, heating stage, TEC cold stage, etc.)

    Product parameters

    Environmental requirements: AC 220V,50Hz,1kW, No need for shock absorber platform

    Acceleration voltage: 3kV~18kV continuously adjustable, 1kV step

    Electron gun: pre aligned tungsten filament, integrated spotlight, no need to manually adjust objective aperture

    Magnification factor: 500-1500000 times

    Detector: secondary electron detector, four segment backscattered electron detector, integrated energy spectrometer

    Sample stage itinerary:XY two axis electric travel: 30 mm × 30 mm

    Sample size:Φ50×35(H)mm

    Working distance: 5-35mm

    vacuum mode

    High vacuum mode: Vacuum extraction time less than 90 seconds

    Low vacuum mode: optional, automatic control for low vacuum 1-100Pa

    Imaging Mode

    Video mode: 512x 512 pixels, no need for small window scanning;

    Quick mode: Scan time less than 3 seconds, 512 x 512 pixels;

    Slow scan mode: scan time less than 40 seconds, 2048 × 2048 pixels;

    Image format: BMP, TIFF,JPEG,PNG

    Navigation function: Optical CCD navigation

    Automatic function: One click automatic configuration of brightness, contrast, and focus

    Size: Main unit 283 × 553 × 505 mm Mechanical pump 340 × 160 × 140 mm

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